Teradyne IP750 图像传感器测试仪

Teradyne IP750 图像传感器测试仪


 

IP750 Test System

Test System for High-Speed, High-Quality Image Sensor Test

Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's  IG-XL software environment provides easy, shorter test program development and easy maintenance.

Applications

Still and Movie Cameras

Smartphones and Media Tablets

DSC cameras

Security cameras

Scanning imagery

Space satellite cameras

Image Detecting Devices

Automotive safety 

Sensors for body scanners

X-rays

Infrared thermograph

Scanning imagery

Advantages

High Throughput

Powerful CPU for image data processing for high pixel resolution device

High speed data transfer at 40Gbps per instrument parallel

Up to 96 sites in parallel test with 16 slot test head

The highest parallelism with high parallel test efficiency available today ensures the lowest COT

Broad Device Coverage - up to 128M Pixels

High versatility for testing a broad range of devices – VGA to 32M pixels with ICUA analog capture and MIPI LVDS capture capability using ICMD

only instrument solution in the market with custom LVDS protocol coverage

Strong SoC test capability with digital instrument for SoC type image sensor

Single Platform

Built on Teradyne’s J750 test platform

IP750 series can be upgraded on-site to IP750Ex-HD or J750Ex-HD to better utilize valuable assets in a rapidly changing market environment

Test Program Compatibility

IP750EP/EMP test programs can run on IP750Ex/Ex-HD with minor conversion

IG-XL Software

Built using Microsoft Excel which provides a user-friendly interface for fast program development

Enables easy upgrade of test programs from single to multisite, dramatically reducing the workload of test engineers on mass production launches

Common software environment for the IP750, J750, and FLEX family, eliminating the need to train test engineers for software programming on separate testers

Configurations

IP750Ex

32 site system capable for wafer test

ICMD 1.5Gbps MIPI D-Phy  image capture instrument

Custom LVDS capture capability with ICMD

ICUA2 up to 100MHz analog image capture instrument

ICUD200 200MHz 32M pixel / Channel 24 bit depth/pixel

HSD200 200MHz Digital instrument

HDDPS 24/48Ch DC source

20Gbps image data transfer  

110mm diameter illuminator support

IP750Ex-HD

96 site system capable for wafer test

ICMD 1.5Gbps MIPI D-Phy  image capture instrument

Custom LVDS capture capability with ICMD

HSD800 400MHz Digital instrument

HDDPS 24/48Ch DC source

40Gbps image data transfer

150mm x 160mm illuminator support

Compatible with J750Ex-HD instruments

System Options

VI Resource

APMU

HDAPMU

HDVIS

Converter Test

CTO

HDCTO  

Software

IG-XL-245x100-TeradyneTeradyne’s award-winning IG-XL Software transforms test program development. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.

Learn more about IG-XL Software