- Epson NS-7160W 集成电路测试机
- 发布时间：2017/6/30 17:20:22 修改时间：2017/6/30 17:20:34 浏览次数：539
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Epson NS-7160W 集成电路测试机
NS7000 Series
NS7160W
- Best handler for multi-site testing of integrated logic/memory devices
- Capable of 16-site simultaneous testing
NS7080W
- Expanded socket area enables docking to a wide variety of socket layouts
Feature
- Fllexible socket layout
- Wide range of available socket layouts including "square 4-site"
- Outstanding basic functions
- High throughput of 7300 UPH (units per hour) and index times from 0.36 sec.
- Steady temperature due to use of a chamber in the test site
- Compatible with a wide range of device types (small, thin, etc.)
- Damage-free testing of ultra thin devices in soft contact mode
- Capable of testing small devices such as MLPTM and MLFTM
- Capable of testing CMOS image sensors and RF devices
- Contact force controlled by electro-pneumatic regulator
- Auto teaching
- Capable of auto teaching using auto-teaching jigs
- ESD (electrostatic discharge) reduction
- Can provide required level of ESD protection
- Multi-lingual operation screen
- Multi-language support available for operation screens
- Side-docking test head
- CE marking
- Options
- One-touch Lock socket Plate
- High Contact Pressure
- Motor Rotator Hand
- Wide Hot Plate
- Cross Sensors
- Different Tray Handling for Loading/Unloading
Main specifications
NS-7000/NS-7080 NS-7080W/NS-7160W Device type QFP,TSOP,CSP,BGA,QFN,PLCC,LGA,PGA,RF Device, CMOS Image sensor Min. 3x3 to Max. 50x50 (Lead pitch: 0.4 mm or more)*1 Test mode 8-site (4x2)*2
Square 4-site (2x2)
In-Line 4-site(4x1)
2-site
Busy Shuttle (single)16-site (8x2)*3
8-site (4x2)
Square 4-site (2x2)
In-Line 4-site(4x1)
2-site
Busy Shuttle (single)Index time 0.36 sec Throughput Max. 7,300 unit per hour Temperature accuracy +50degC to + 90degC ±2degC*3 +90degC to +130degC ±3degC*3 Dimension (mm) 1,640(W) x 1,580(D) x 1860(H)*4 1,800(W) x 1,580(D) x 1860(H)*4 Weight Approx. 1,120Kg Applox. 1,190kg
