Epson NS-7160W 集成电路测试机

Epson NS-7160W 集成电路测试机

 

NS7000 Series

NS7160W

• Best handler for multi-site testing of integrated logic/memory devices
• Capable of 16-site simultaneous testing

NS7080W

• Expanded socket area enables docking to a wide variety of socket layouts

 

Feature

1. Fllexible socket layout
   • Wide range of available socket layouts including "square 4-site"
2. Outstanding basic functions
   • High throughput of 7300 UPH (units per hour) and index times from 0.36 sec.
   • Steady temperature due to use of a chamber in the test site
3. Compatible with a wide range of device types (small, thin, etc.)
   • Damage-free testing of ultra thin devices in soft contact mode
   • Capable of testing small devices such as MLPTM and MLFTM
   • Capable of testing CMOS image sensors and RF devices
4. Contact force controlled by electro-pneumatic regulator
5. Auto teaching
   • Capable of auto teaching using auto-teaching jigs
6. ESD (electrostatic discharge) reduction
   • Can provide required level of ESD protection
7. Multi-lingual operation screen
   • Multi-language support available for operation screens
8. Side-docking test head
9. CE marking
10. Options
    • One-touch Lock socket Plate
    • High Contact Pressure
    • Motor Rotator Hand
    • Wide Hot Plate
    • Cross Sensors
    • Different Tray Handling for Loading/Unloading

 

Main specifications

	NS-7000/NS-7080	NS-7080W/NS-7160W
Device type	QFP,TSOP,CSP,BGA,QFN,PLCC,LGA,PGA,RF Device, CMOS Image sensor
	Min. 3x3 to Max. 50x50 (Lead pitch: 0.4 mm or more)*1
Test mode	8-site (4x2)*2 Square 4-site (2x2) In-Line 4-site(4x1) 2-site Busy Shuttle (single)	16-site (8x2)*3 8-site (4x2) Square 4-site (2x2) In-Line 4-site(4x1) 2-site Busy Shuttle (single)
Index time	0.36 sec
Throughput	Max. 7,300 unit per hour
Temperature accuracy	+50degC to + 90degC ±2degC*3
	+90degC to +130degC ±3degC*3
Dimension (mm)	1,640(W) x 1,580(D) x 1860(H)*4	1,800(W) x 1,580(D) x 1860(H)*4
Weight	Approx. 1,120Kg	Applox. 1,190kg